Presentation

QR Lab is a micro and nanofabrication center in INRiM, the national institute for metrological research in Italy, consisting of five laboratories (ISO 5 and ISO 8) dedicated to the deposition, etching and patterning of surfaces and thin films, using the most consolidated methods such as optical and laser lithography and nanolithography by electron and ion beams, in combination with unconventional methods like self-assembly lithography based on nanospheres and block copolymers.
The main research and technological activities that take place within the laboratory are dedicated to memristive devices for quantum metrology and neuromorphic computation, superconducting quantum devices for metrology and sensing, metamaterials and metasurfaces for nanophotonics applications, sensing devices based on nanostructures and nanowires, up to nanostructured magnetic thin films for the development of storage devices and fundamental studies on magnetization.

Websites:
https://www.inrim.it/it/ricerca/infrastrutture/qr-labs-nanofacility-piemonte
https://www.inrim.it/it/ricerca/settori-scientifici/scienza-e-tecnologia-alla-nanoscala
https://amdgroup.inrim.it/home

Publications

Leonetti, G., Fretto, M., Pirri, F.C., De Leo, N., Valov, I., Milano, G.
Effect of electrode materials on resistive switching behaviour of NbO_x-based memristive devices
Scientific Reports, 2023, 13(1), 17003
DOI: 10.1038/s41598-023-44110-w

Leonetti, G., Fretto, M., Bejtka, K., Olivetti, E. S., Pirri, F. C., De Leo, N., Valov, I., Milano, G.
Resistive switching and role of interfaces in memristive devices based on amorphous NbO_x grown by anodic oxidation
Physical Chemistry Chemical Physics, 2023, 25(21), pp. 14766–14777
DOI: 10.1039/d3cp01160g

Sharma, M., Singh, M., Rakshit, R.K., Singh, Surinder, P., Fretto, M., De Leo, N., Perali, A., Pinto, N.
Complex Phase-Fluctuation Effects Correlated with Granularity in Superconducting NbN Nanofilms
Nanomaterials, 2022, 12(23), 4109
DOI: 10.3390/nano12234109

Milano, G., Ferrarese Lupi, F., Fretto, M., Ricciardi, C., De Leo, N., Boarino, L.
Memristive Devices for Quantum Metrology
Advanced Quantum Technologies, 2020, 3(5), 2000009
DOI: 10.1002/qute.202000009